TY - GEN
T1 - Clustering of laser measurements via the Dirichlet process mixture model for object tracking
AU - Lee, Yung Chou
AU - Hsiao, Te-Sheng
AU - Chang, Chih Tang
PY - 2012
Y1 - 2012
N2 - In this paper, the Dirichlet process mixture model is used to describe the distribution of the whole laser measurements in a given scan. Then the number of clusters is inferred from the measurements by the Gibbs sampler. We focus on the automotive application which usually has a more complex environment. Due to the variant shapes and sizes of the real traffic objects, the multi-class DP-based clustering model, which is incorporated with a mixture prior distribution, is proposed to cluster the measurements more properly. The clustering results of the proposed method are compared with those of several existing clustering methods both in an expressway case and in an urban road case. The corresponding tracking performances are also analyzed and the improvements of the proposed method are presented.
AB - In this paper, the Dirichlet process mixture model is used to describe the distribution of the whole laser measurements in a given scan. Then the number of clusters is inferred from the measurements by the Gibbs sampler. We focus on the automotive application which usually has a more complex environment. Due to the variant shapes and sizes of the real traffic objects, the multi-class DP-based clustering model, which is incorporated with a mixture prior distribution, is proposed to cluster the measurements more properly. The clustering results of the proposed method are compared with those of several existing clustering methods both in an expressway case and in an urban road case. The corresponding tracking performances are also analyzed and the improvements of the proposed method are presented.
UR - http://www.scopus.com/inward/record.url?scp=84866940855&partnerID=8YFLogxK
U2 - 10.1109/AIM.2012.6265917
DO - 10.1109/AIM.2012.6265917
M3 - Conference contribution
AN - SCOPUS:84866940855
SN - 9781467325752
T3 - IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM
SP - 837
EP - 842
BT - AIM 2012 - 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Conference Digest
T2 - 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2012
Y2 - 11 July 2012 through 14 July 2012
ER -