ChiYun compact: A novel test compaction technique for responses with unknown values

Chia-Tso Chao*, Seongmoon Wang, Srimat T. Chakradhar, Kwang Ting Cheng

*此作品的通信作者

研究成果: Conference contribution同行評審

6 引文 斯高帕斯(Scopus)

摘要

This paper proposes a response compactor, named ChiYun compactor, to compact scan-out responses in the presence of unknown values. By adding storage elements into an Xor network, a ChiYun compactor can offer multiple chances for a scan-out response to be observed at ATE channels in one to several scan-shift cycles. We also develop a mathematical analysis to predict the percent-age of scan-out responses masked by the unknown values for the ChiYun compactor. With this analysis, we can derive the optimal, configuration of a ChiYun compactor for minimizing the masking of scan-out responses. We further propose a selection scheme for the ChiYun compactor to selectively observe partial Xor results for improving the fault coverage. The experimental results demonstrate the effectiveness of the proposed mathematical analysis and the selection scheme. We also demonstrate that the unknown tolerance of a ChiYun compactor is higher than that of a state-of-the-art response compactor proposed in [11].

原文English
主出版物標題Proceedings - 2005 IEEE International Conference on Computer Design
主出版物子標題VLSI in Computers and Processors, ICCD 2005
頁面147-152
頁數6
DOIs
出版狀態Published - 2005
事件2005 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 2005 - San Jose, CA, United States
持續時間: 2 10月 20055 10月 2005

出版系列

名字Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
2005
ISSN(列印)1063-6404

Conference

Conference2005 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 2005
國家/地區United States
城市San Jose, CA
期間2/10/055/10/05

指紋

深入研究「ChiYun compact: A novel test compaction technique for responses with unknown values」主題。共同形成了獨特的指紋。

引用此