Charge relaxation associated with photon-induced deactivation of various traps in MAPbI3 films

F. S. Chien*, A. Herawati, C. M. Ho, H. L. Hsiao, T. S. Lim, C. R. Wang, K. K. Ng, S. Das, F. J. Kao, M. C. Wu*

*此作品的通信作者

研究成果: Article同行評審

指紋

深入研究「Charge relaxation associated with photon-induced deactivation of various traps in MAPbI3 films」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy