Charge relaxation associated with photon-induced deactivation of various traps in MAPbI3 films

F. S. Chien*, A. Herawati, C. M. Ho, H. L. Hsiao, T. S. Lim, C. R. Wang, K. K. Ng, S. Das, F. J. Kao, M. C. Wu*

*此作品的通信作者

研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)

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Keyphrases

Chemistry

Engineering

Chemical Engineering