Charge quantity influence on resistance switching characteristic during forming process

Tian Jian Chu*, Ting Chang Chang, Tsung Ming Tsai, Hsing Hua Wu, Jung Hui Chen, Kuan Chang Chang, Tai Fa Young, Kai Hsang Chen, Yong En Syu, Geng Wei Chang, Yao Feng Chang, Min Chen Chen, Jyun Hao Lou, Jhih Hong Pan, Jian Yu Chen, Ya-Hsiang Tai, Cong Ye, Hao Wang, Simon M. Sze

*此作品的通信作者

研究成果: Article同行評審

62 引文 斯高帕斯(Scopus)

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Engineering