Charge carrier transport mechanism in high-κ dielectrics and their based resistive memory cells

D. R. Islamov*, V. A. Gritsenko, C. H. Cheng, Albert Chin

*此作品的通信作者

研究成果: Article › 同行評審

3 引文 斯高帕斯（Scopus）

指紋

深入研究「Charge carrier transport mechanism in high-κ dielectrics and their based resistive memory cells」主題。共同形成了獨特的指紋。

Keyphrases

Material Science