Characterization on ESD devices with test structures in silicon Germanium RF BiCMOS process

Ming-Dou Ker*, Woei Lin Wu, Chyh Yih Chang

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    研究成果: Paper › 同行評審

    1 引文 斯高帕斯（Scopus）

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    Engineering

    Computer Science

    Material Science

    Physics

    Medicine and Dentistry