@article{39a34b4d18764b958a71baf9b43bf715,
title = "Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy",
abstract = "Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge2Sb2Te5 film.",
keywords = "Electronic data storage, Materials and process characterization, Optical recording, Phase-change materials",
author = "Chang, {Chia Min} and Liu, {Yen Ju} and Tseng, {Ming Lun} and Chu, {Nien Nan} and Huang, {Ding Wei} and Masud Mansuripur and Tsai, {Din Ping}",
year = "2012",
month = oct,
doi = "10.1002/pssb.201200356",
language = "English",
volume = "249",
pages = "1945--1950",
journal = "Physica Status Solidi (B) Basic Research",
issn = "0370-1972",
publisher = "Wiley-VCH Verlag",
number = "10",
}