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Characteristics variability of novel lateral asymmetry nano-MOSFETs due to random discrete dopant
Kou Fu Lee
*
, Chih Hong Hwang, Tien Yeh Li,
Yi-Ming Li
*
此作品的通信作者
電機工程學系
研究成果
:
Conference contribution
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深入研究「Characteristics variability of novel lateral asymmetry nano-MOSFETs due to random discrete dopant」主題。共同形成了獨特的指紋。
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Keyphrases
Doping Profile
100%
High-frequency Characteristics
100%
Nano-MOSFET
100%
Near-source
100%
Random Discrete Dopants
100%
Lateral Asymmetry
100%
MOSFET
50%
Bulk MOSFET
50%
Dopant Distribution
50%
Short Channel Effects
50%
Device Characteristics
50%
Channel Doping
50%
Gate Capacitance
50%
Sub-20 Nm
50%
Random Dopants
50%
Discrete Dopants
50%
Lateral Asymmetric Channel
50%
Characteristic Fluctuation
50%
Asymmetric Doping
50%
Capacitance-frequency Characteristics
50%
Engineering
Dopants
100%
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Frequency Characteristic
66%
Field Effect Transistor
33%
Channel Region
33%
Channel Device
33%
Gate Capacitance
33%
Drain End
33%
Material Science
Doping (Additives)
100%
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Silicon
33%
Field Effect Transistor
33%
Capacitance
33%