Characteristics variability of novel lateral asymmetry nano-MOSFETs due to random discrete dopant

Kou Fu Lee*, Chih Hong Hwang, Tien Yeh Li, Yi-Ming Li

*此作品的通信作者

研究成果: Conference contribution同行評審

指紋

深入研究「Characteristics variability of novel lateral asymmetry nano-MOSFETs due to random discrete dopant」主題。共同形成了獨特的指紋。

Keyphrases

Engineering

Material Science