Characteristic fluctuations of dynamic power delay induced by random nanosized titanium nitride grains and the aspect ratio effect of gate-all-around nanowire CMOS devices and circuits
Yi-Ming Li*, Chieh Yang Chen, Min Hui Chuang, Pei Jung Chao
深入研究「Characteristic fluctuations of dynamic power delay induced by random nanosized titanium nitride grains and the aspect ratio effect of gate-all-around nanowire CMOS devices and circuits」主題。共同形成了獨特的指紋。