Characteristic fluctuations of dynamic power delay induced by random nanosized titanium nitride grains and the aspect ratio effect of gate-all-around nanowire CMOS devices and circuits

Yi-Ming Li*, Chieh Yang Chen, Min Hui Chuang, Pei Jung Chao

*此作品的通信作者

研究成果: Article同行評審

6 引文 斯高帕斯(Scopus)

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深入研究「Characteristic fluctuations of dynamic power delay induced by random nanosized titanium nitride grains and the aspect ratio effect of gate-all-around nanowire CMOS devices and circuits」主題。共同形成了獨特的指紋。

Keyphrases

Engineering