摘要
In this work, the carrier dynamics in Zn1-xCdxO thin films with different Cd contents grown by molecular beam epitaxy system have been investigated using photoluminescence and time-resolved photoluminescence measurements. The carrier lifetime can be estimated from the PL decay curve fitted by triple exponential function. The emission energy dependence and temperature dependence of the PL decay time indicate that carrier localization dominate the luminescence mechanism of the ZnCdO alloy semiconductor.
原文 | English |
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文章編號 | 012005 |
期刊 | IOP Conference Series: Materials Science and Engineering |
卷 | 131 |
發行號 | 1 |
DOIs | |
出版狀態 | Published - 6 6月 2016 |
事件 | 4th International Conference on Manufacturing, Optimization, Industrial and Material Engineering, MOIME 2016 - Bali, 印度尼西亞 持續時間: 19 3月 2016 → 20 3月 2016 |