Broadband characterization of miniaturized on-chip differential circuits using G-S-G probe

Hung Ta Tso; Chien-Nan Kuo

doi:10.1109/EPEP.2004.1407567

Broadband characterization of miniaturized on-chip differential circuits using G-S-G probe

Hung Ta Tso^*, Chien-Nan Kuo

^*此作品的通信作者

研究成果 › 同行評審

摘要

An approach is presented to characterize on-chip differential coplanar-strip-line (CPS) test circuits using G-S-G probes. With a symmetric duplicate of the test circuit in shunt connection, the circuit can be characterized over a wide frequency range. This method is especially effective to miniaturized circuits. A 40-GHz silicon-based filter is employed for demonstration.

原文	English
頁面	139-142
頁數	4
DOIs	https://doi.org/10.1109/EPEP.2004.1407567
出版狀態	Published - 1 12月 2004
事件	IEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging - Portland, OR, 美國持續時間: 25 10月 2004 → 27 10月 2004

Conference

Conference	IEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging
國家/地區	美國
城市	Portland, OR
期間	25/10/04 → 27/10/04

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10.1109/EPEP.2004.1407567

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引用此

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title = "Broadband characterization of miniaturized on-chip differential circuits using G-S-G probe",

abstract = "An approach is presented to characterize on-chip differential coplanar-strip-line (CPS) test circuits using G-S-G probes. With a symmetric duplicate of the test circuit in shunt connection, the circuit can be characterized over a wide frequency range. This method is especially effective to miniaturized circuits. A 40-GHz silicon-based filter is employed for demonstration.",

author = "Tso, {Hung Ta} and Chien-Nan Kuo",

year = "2004",

month = dec,

day = "1",

doi = "10.1109/EPEP.2004.1407567",

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AU - Tso, Hung Ta

AU - Kuo, Chien-Nan

PY - 2004/12/1

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N2 - An approach is presented to characterize on-chip differential coplanar-strip-line (CPS) test circuits using G-S-G probes. With a symmetric duplicate of the test circuit in shunt connection, the circuit can be characterized over a wide frequency range. This method is especially effective to miniaturized circuits. A 40-GHz silicon-based filter is employed for demonstration.

AB - An approach is presented to characterize on-chip differential coplanar-strip-line (CPS) test circuits using G-S-G probes. With a symmetric duplicate of the test circuit in shunt connection, the circuit can be characterized over a wide frequency range. This method is especially effective to miniaturized circuits. A 40-GHz silicon-based filter is employed for demonstration.

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U2 - 10.1109/EPEP.2004.1407567

DO - 10.1109/EPEP.2004.1407567

M3 - Paper

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EP - 142

T2 - IEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging

Y2 - 25 October 2004 through 27 October 2004

ER -

Broadband characterization of miniaturized on-chip differential circuits using G-S-G probe

摘要

Conference

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