Broadband characterization of miniaturized on-chip differential circuits using G-S-G probe

Hung Ta Tso*, Chien-Nan Kuo

*此作品的通信作者

    研究成果: Paper同行評審

    摘要

    An approach is presented to characterize on-chip differential coplanar-strip-line (CPS) test circuits using G-S-G probes. With a symmetric duplicate of the test circuit in shunt connection, the circuit can be characterized over a wide frequency range. This method is especially effective to miniaturized circuits. A 40-GHz silicon-based filter is employed for demonstration.

    原文English
    頁面139-142
    頁數4
    DOIs
    出版狀態Published - 1 12月 2004
    事件IEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging - Portland, OR, United States
    持續時間: 25 10月 200427 10月 2004

    Conference

    ConferenceIEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging
    國家/地區United States
    城市Portland, OR
    期間25/10/0427/10/04

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