TY - GEN
T1 - Boosting semi-supervised anomaly detection via contrasting synthetic images
AU - Yu, Sheng Feng
AU - Chiu, Wei Chen
N1 - Publisher Copyright:
© 2021 MVA Organization.
PY - 2021/7/25
Y1 - 2021/7/25
N2 - In this paper we propose to tackle the problem of semi-supervised anomaly detection, which aims to learn the outlier detector from the training set composed of only inliers. Built upon the recent advances of introducing contrastive learning to achieve the state-of-the-art of anomaly detection, we propose a simple but effective extension to further boost the performance via integrating the contrastive learning and the generative model of inliers into a unified framework. On one hand, the contrastive learning amongst the real samples and synthetic ones produced by the generative model improves the representation learning; on the other hand, the generative model learning is also benefited from the contrastive learning. We conduct extensive experiments to demonstrate the efficacy of our proposed method to advance anomaly detection, its superiority against several baselines, and the contribution of our model designs.
AB - In this paper we propose to tackle the problem of semi-supervised anomaly detection, which aims to learn the outlier detector from the training set composed of only inliers. Built upon the recent advances of introducing contrastive learning to achieve the state-of-the-art of anomaly detection, we propose a simple but effective extension to further boost the performance via integrating the contrastive learning and the generative model of inliers into a unified framework. On one hand, the contrastive learning amongst the real samples and synthetic ones produced by the generative model improves the representation learning; on the other hand, the generative model learning is also benefited from the contrastive learning. We conduct extensive experiments to demonstrate the efficacy of our proposed method to advance anomaly detection, its superiority against several baselines, and the contribution of our model designs.
UR - http://www.scopus.com/inward/record.url?scp=85113938145&partnerID=8YFLogxK
U2 - 10.23919/MVA51890.2021.9511395
DO - 10.23919/MVA51890.2021.9511395
M3 - Conference contribution
AN - SCOPUS:85113938145
T3 - Proceedings of MVA 2021 - 17th International Conference on Machine Vision Applications
BT - Proceedings of MVA 2021 - 17th International Conference on Machine Vision Applications
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 17th International Conference on Machine Vision Applications, MVA 2021
Y2 - 25 July 2021 through 27 July 2021
ER -