@inproceedings{135210ae0e5040eb8b227f773700d8c4,
title = "Board level ESD of driver ICs on LCD panels",
abstract = "A method utilizing Charged Device Model (CDM) discharging to emulate real-world Charged Board Model (CBM) discharging was proposed and successfully addressed the weakest spot of whole chip. In order to extract the correlation between CDM pre-fail voltage VCDM and CBM pre-fail voltage V CBM, the capacitance and discharging waveforms of output pin on an IC and Printed Circuit Board (PCB) were measured. The results showed that the CBM evaluation board (EB) was not a must for large-size chip, as LCD driver ICs. CDM discharging can be used to direct investigate the weak point of design/layout for large-size chip. Besides, this paper addresses the guidelines about chip-level ESD cell design and layout optimization against CBM ESD damage.",
keywords = "CBM, CDM, ESD, HBM, PCB",
author = "Hsu, {C. T.} and Tseng, {J. C.} and Chen, {Y. L.} and Tsai, {F. Y.} and Yu, {S. H.} and Chen, {P. A.} and Ming-Dou Ker",
year = "2007",
month = sep,
day = "25",
doi = "10.1109/RELPHY.2007.369965",
language = "English",
isbn = "1424409195",
series = "Annual Proceedings - Reliability Physics (Symposium)",
pages = "590--591",
booktitle = "2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual",
note = "45th Annual IEEE International Reliability Physics Symposium 2007, IRPS ; Conference date: 15-04-2007 Through 19-04-2007",
}