Bimodel onset strain relaxation in InAs quantum dots with an InGaAs capping layer

Jenn-Fang Chen, Ross C.C. Chen, C. H. Chiang, Yung-Fu Chen, Y. H. Wu, Li Chang

研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)

摘要

Capping InAs quantum dots (QDs) with an InGaAs layer allows strain relaxation to induce a low-energy electron state below a set of fine dot family states, which is consistent with photoluminescence (PL) spectra. The evolution of InAs thickness suggests a bimodal onset relaxation, i.e., a fine dot family that is strain-relieved by indium outdiffusion from the QDs, as suggested by transmission electron microscopy, and a low-energy dot family that is strain relaxed by the generation of lattice misfits. The indium outdiffusion can explain an abnormal PL blueshift in 70 meV in the fine dot family at onset of strain relaxation.

原文English
文章編號092110
頁數3
期刊Applied Physics Letters
97
發行號9
DOIs
出版狀態Published - 30 8月 2010

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