To solve the trade-off between the switching loss and the current/voltage overshoot of power transistors, a digital gate driver is effective. A temperature and load current dependent optimization of the gate driving vectors (GV) for the digital gate drivers, however, is required . Robust gate driving vectors (RGV) to the temperature and load current variations are proposed in . The test cost to search RGV, however, is very high. To reduce the test cost, a robust simulated annealing (RSA) for an automatic search method of RGV is proposed. In the proposed RSA, instead of changing the operating conditions, GV is varied in a single operating condition. Compared with the conventional method to search RGV , the proposed RSA reduces the measurement time by more than 85 % (from more than 5.5 hours to less than 50 minutes), which results in the reduced test cost.