Automatic Search Method of Robust Gate Driving Vectors for Digital Gate Drivers against Variations in Operating Conditions of IGBT's

Ting Wei Wang, Toru Sai, Ryuzo Morikawa, Katsuhiro Hata, Takayasu Sakurai, Po-Hung Chen, Makoto Takamiya

研究成果: Conference contribution同行評審

摘要

To solve the trade-off between the switching loss and the current/voltage overshoot of power transistors, a digital gate driver is effective. A temperature and load current dependent optimization of the gate driving vectors (GV) for the digital gate drivers, however, is required [7]. Robust gate driving vectors (RGV) to the temperature and load current variations are proposed in [9]. The test cost to search RGV, however, is very high. To reduce the test cost, a robust simulated annealing (RSA) for an automatic search method of RGV is proposed. In the proposed RSA, instead of changing the operating conditions, GV is varied in a single operating condition. Compared with the conventional method to search RGV [9], the proposed RSA reduces the measurement time by more than 85 % (from more than 5.5 hours to less than 50 minutes), which results in the reduced test cost.

原文English
主出版物標題ECCE 2020 - IEEE Energy Conversion Congress and Exposition
發行者Institute of Electrical and Electronics Engineers Inc.
頁面3798-3802
頁數5
ISBN(電子)9781728158266
DOIs
出版狀態Published - 11 10月 2020
事件12th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2020 - Virtual, Detroit, United States
持續時間: 11 10月 202015 10月 2020

出版系列

名字ECCE 2020 - IEEE Energy Conversion Congress and Exposition

Conference

Conference12th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2020
國家/地區United States
城市Virtual, Detroit
期間11/10/2015/10/20

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