Automatic Industry PCB Board DIP Process Defect Detection with Deep Ensemble Method

Yu Ting Li, Paul Kuo, Jiun In Guo

研究成果: Conference contribution同行評審

21 引文 斯高帕斯(Scopus)

摘要

The conventional PCB (Printed Circuit Board) DIP (Dual Inline Package) process solder defect detection was done by labor inspection, which is not only time-intensive but also labor-intensive. This paper proposes a deep ensemble method to inspect the PCB solder defects to replace the labor inspection. To achieve a high detection rate and a low false alarm rate, two distinct detection models, a hybrid YOLOv2 (YOLOv2 as a foreground detector and ResNet-101 as a classifier) and Faster RCNN with ResNet-101 and FPN are separately trained to obtain a high detection rate result. The final ensemble model aggregates the result from the two detection models. That achieves a 96.73% detection rate and a 19.73% false alarm rate in real tests. The detection time is less than 15 seconds for inferencing a PCB image with a resolution of 7296∗6000. The proposed method has been proven efficient in terms of guiding operators to identify and fix PCB solder defects [1] and thus is able to reduce 33% of labor demand for each PCB production line at our real test site. [1].

原文English
主出版物標題2020 IEEE 29th International Symposium on Industrial Electronics, ISIE 2020 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
頁面453-459
頁數7
ISBN(電子)9781728156354
DOIs
出版狀態Published - 6月 2020
事件29th IEEE International Symposium on Industrial Electronics, ISIE 2020 - Delft, Netherlands
持續時間: 17 6月 202019 6月 2020

出版系列

名字IEEE International Symposium on Industrial Electronics
2020-June

Conference

Conference29th IEEE International Symposium on Industrial Electronics, ISIE 2020
國家/地區Netherlands
城市Delft
期間17/06/2019/06/20

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