TY - GEN
T1 - Automatic circuit sizing technique for the analog circuits with flexible TFTs considering process variation and bending effects
AU - Chen, Yen Lung
AU - Wu, Wan Rong
AU - Lu, Guan Ruei
AU - Liu, Chien-Nan
PY - 2013
Y1 - 2013
N2 - Flexible electronics are possible alternative for portable consumer applications with many advantages. However, the circuit design for flexible electronics is still challenging, especially for sensitive analog circuits. Significant parameter variations and bending effects of flexible TFTs further increase the difficulties for circuit designers. In this paper, an automatic circuit sizing technique is proposed for the analog circuits with flexible TFTs. The process variation and bending effects of flexible TFTs are considered simultaneously in the optimization flow. As shown in the experimental results, the proposed approach can further improve the design yield and significantly reduce the design overhead.
AB - Flexible electronics are possible alternative for portable consumer applications with many advantages. However, the circuit design for flexible electronics is still challenging, especially for sensitive analog circuits. Significant parameter variations and bending effects of flexible TFTs further increase the difficulties for circuit designers. In this paper, an automatic circuit sizing technique is proposed for the analog circuits with flexible TFTs. The process variation and bending effects of flexible TFTs are considered simultaneously in the optimization flow. As shown in the experimental results, the proposed approach can further improve the design yield and significantly reduce the design overhead.
UR - http://www.scopus.com/inward/record.url?scp=84885644814&partnerID=8YFLogxK
U2 - 10.7873/DATE.2013.297
DO - 10.7873/DATE.2013.297
M3 - Conference contribution
AN - SCOPUS:84885644814
SN - 9783981537000
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 1458
EP - 1461
BT - Proceedings - Design, Automation and Test in Europe, DATE 2013
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013
Y2 - 18 March 2013 through 22 March 2013
ER -