Auto defect detection of A-IGZO thin film transistor backplane on foldable medical array panel application

Yu Min Hung, Yao Chin Wang*, Yu Ching Yang, Bor Shyh Lin, Bor Shing Lin

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

This article reported on the pixel flaw detection properties of amorphous In-Ga-Zn-O-based active thin film transistors on flexible medical panel substrate application, which is using the non-invasive optoelectronic transforming inspection technique. The experimental data exactly showed good flaw detection rate > 90% and stable uniformity < 5%. Currently, it is a popular method with electrical testing and detection with advantages of ultrahigh resolution and small-pixel-sized medical panel, and no contact damaged to the application of flexible medical panel substrates.

原文English
主出版物標題Proceedings of Computing Conference 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1423-1425
頁數3
ISBN(電子)9781509054435
DOIs
出版狀態Published - 8 1月 2018
事件2017 SAI Computing Conference 2017 - London, United Kingdom
持續時間: 18 7月 201720 7月 2017

出版系列

名字Proceedings of Computing Conference 2017
2018-January

Conference

Conference2017 SAI Computing Conference 2017
國家/地區United Kingdom
城市London
期間18/07/1720/07/17

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