Application of supercritical fluids for amorphous silicon thin film transistors

Chih Tsung Tsai*, Ting Chang Chang, Po-Tsun Liu, Po Yu Yang

*此作品的通信作者

研究成果: Paper同行評審

摘要

Supercritical fluid technology[1-2] is employed for the first time to passivate the defect states in amorphous silicon thin film transistors (a-Si:H TFTs) at low temperature (150°C). Due to supercritical fluids have gas-like properties of diffusivity and viscosity that allow it to efficiently carry H2O molecule into amorphous thin film and passivates defects at low temperature. Experiment results indicate that superior transfer characteristic is obtained and the density of states (DOS) is reduced significantly after the treatment of supercritical fluids mixed with water/propyl alcohol.

原文English
頁面479-480
頁數2
出版狀態Published - 12月 2006
事件13th International Display Workshops, IDW '06 - Otsu, 日本
持續時間: 6 12月 20066 12月 2006

Conference

Conference13th International Display Workshops, IDW '06
國家/地區日本
城市Otsu
期間6/12/066/12/06

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