跳至主導覽
跳至搜尋
跳過主要內容
國立陽明交通大學研發優勢分析平台 首頁
English
中文
首頁
人員
單位
研究成果
計畫
獎項
活動
貴重儀器
影響
按專業知識、姓名或所屬機構搜尋
Annealing temperature dependence of electric conduction and capacitance dispersion in nitrogen-implanted GaAs
Jenn-Fang Chen
*
, M. M. Huang, J. S. Wang
*
此作品的通信作者
電子物理學系
研究成果
:
Article
›
同行評審
總覽
指紋
指紋
深入研究「Annealing temperature dependence of electric conduction and capacitance dispersion in nitrogen-implanted GaAs」主題。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Keyphrases
Annealing
100%
Gallium Arsenide
100%
Temperature Effect
100%
Annealing Temperature
100%
Capacitance Dispersion
100%
Electrical Conduction
100%
Electrical Capacitance
100%
Activation Energy
66%
Current-voltage
33%
Capacitance Model
33%
Capacitance Variable Time
33%
Secondary Ion Mass Spectrometry
33%
Equivalent Circuit
33%
Frequency Estimation
33%
Defect States
33%
Annealing Behavior
33%
Deep Traps
33%
High-temperature Annealing
33%
High-frequency Capacitance
33%
Capacitance-frequency
33%
Variable Range Hopping
33%
Engineering
Gallium Arsenide
100%
Annealing Temperature
100%
Temperature Dependence
100%
Implanted Sample
100%
Activation Energy
66%
Constant Time
33%
Data Show
33%
Resistive
33%
Equivalent Circuit
33%
Measurement Frequency
33%
Range Variable
33%
Material Science
Gallium Arsenide
100%
Capacitance
100%
Annealing
60%
Activation Energy
40%
Electronic Circuit
20%
Secondary Ion Mass Spectrometry
20%