@inproceedings{b726623856b3436898ea15c945ac9e33,
title = "Anisotropic structure induced electrical properties of a-plane InN",
abstract = "Terahertz spectroscopy reveals that the anisotropic electrical properties of nonpolar InN film along in-plane c-axis and in-plane m-axis are determined by the orientation of narrow and thin stacking faults, not by the density of defects.",
author = "Chang, {P. H.} and Chia, {J. W.} and S. Gwo and Hyeyoung Ahn",
year = "2013",
month = jan,
day = "1",
doi = "10.1364/CLEO_QELS.2013.JTh2A.56",
language = "English",
isbn = "9781557529725",
series = "2013 Conference on Lasers and Electro-Optics, CLEO 2013",
publisher = "IEEE Computer Society",
booktitle = "2013 Conference on Lasers and Electro-Optics, CLEO 2013",
address = "美國",
note = "2013 Conference on Lasers and Electro-Optics, CLEO 2013 ; Conference date: 09-06-2013 Through 14-06-2013",
}