摘要
We have deposited the c-axis-oriented orthorhombic TbMnO3 (o-TMO) films with well-aligned in-plane orientations on NdGaO3 (001) substrates by using pulsed laser deposition. The distinctive orientation alignments between the film and substrate allow the study of the X-ray absorption spectroscopy (XAS) with the electric field along three major crystallographic directions, respectively. Polarization-dependent XAS spectra show significant anisotropy in the electronic structure of o-TMO. The correlation between the electronic structure, the bonding anisotropy, and the magnetoelectric effect in the multiferroic materials is revealed.
原文 | American English |
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頁(從 - 到) | 2275-2279 |
頁數 | 5 |
期刊 | Thin Solid Films |
卷 | 518 |
發行號 | 8 |
DOIs | |
出版狀態 | Published - 1 2月 2010 |