Analytically modeling nonlinear DC-gain for Op-amps

Fu-Chuang Chen, J. Y. Lin

研究成果: Conference contribution同行評審

摘要

Op-amp dc-gain is nonlinear, and this can cause distortions in various applications. However, so far no efficient tool is available for analyzing dc-gain nonlinearity; the dc-gain curve can only be generated from a designed op-amp. If the dc-gain nonlinearity is too serious, one has to redesign op-amps. Time-consuming iterations involving transistor-level designs and simulations may be needed before an acceptable result is achieved. In this brief, an analytical op-amp dc-gain curve model is proposed. After entering circuit parameters and process parameters into this model, it can generate op-amp nonlinear dc-gain curves to facilitate subsequent distortion analyses, requiring no transistor- level designs and simulations. This dc-gain model applies to general two-stage op-amps, and can accommodate various 1st stage configurations, including cascode and folded cascode ones. Our analyses show that the smaller VDD is, the more precise the analytical model becomes. Simulations demonstrate that, when VDD ≤ 1.8V, the error between the curve from the model and the curve generated from SPICE simulation is less than 2%.

原文English
主出版物標題Testing and Measurement
主出版物子標題Techniques and Applications - Proceedings of the 2015 International Conference on Testing and Measurement: Techniques and Applications, TMTA 2015
編輯Kennis Chan
發行者CRC Press/Balkema
頁面239-242
頁數4
ISBN(列印)9781138028128
DOIs
出版狀態Published - 2015
事件International Conference on Testing and Measurement: Techniques and Applications, TMTA 2015 - Phuket Island, 泰國
持續時間: 16 1月 201517 1月 2015

出版系列

名字Testing and Measurement: Techniques and Applications - Proceedings of the 2015 International Conference on Testing and Measurement: Techniques and Applications, TMTA 2015

Conference

ConferenceInternational Conference on Testing and Measurement: Techniques and Applications, TMTA 2015
國家/地區泰國
城市Phuket Island
期間16/01/1517/01/15

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