摘要
Recent advances in analytical techniques let us measure the properties and control the quality of microstructures and let us use them to study novel physical phenomena.
原文 | English |
---|---|
頁面 | 34-38 |
頁數 | 5 |
卷 | 33 |
無 | 5 |
專業出版物 | Physics Today |
DOIs | |
出版狀態 | Published - 1 1月 1980 |