Analysis of thin films and interfaces

John M. Poate, King-Ning Tu

研究成果: Article

5 引文 斯高帕斯(Scopus)

摘要

Recent advances in analytical techniques let us measure the properties and control the quality of microstructures and let us use them to study novel physical phenomena.

原文English
頁面34-38
頁數5
33
5
專業出版物Physics Today
DOIs
出版狀態Published - 1 1月 1980

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