Analysis of the proximity effect and the interface transparency with perpendicular current in Ni/Nb system

S. Y. Huang; Y. C. Chiu; J. J. Liang; L. K. Lin; T. C. Tsai; Shih-Ying Hsu; S. F. Lee

doi:10.1063/1.3073657

Analysis of the proximity effect and the interface transparency with perpendicular current in Ni/Nb system

S. Y. Huang, Y. C. Chiu, J. J. Liang, L. K. Lin, T. C. Tsai, Shih-Ying Hsu, S. F. Lee

電子物理學系

研究成果: Article › 同行評審

3 引文斯高帕斯（Scopus）

摘要

We quantitatively study the interface resistance in Ni/Nb multilayers fabricated by sputtering system. For a fixed Ni layer thickness in Ni/Nb/Ni trilayers, the superconducting temperature Tc decreases with decreasing Nb thickness. By analyzing the data with the proximity effect, the critical thickness below which superconductivity vanished was deduced. From current perpendicular to plane (CPP) measurement interpreted with a one-band series-resistor model, we obtained the CPP resistivities of Nb and Ni and the unit area resistances of 4.2±0.2 and 1.5±0.4 f m2 for superconducting and normal Ni/Nb interfaces. The transparency parameter is directly calculated in terms of interface resistance.

原文	English
文章編號	07E319
期刊	Journal of Applied Physics
卷	105
發行號	7
DOIs	https://doi.org/10.1063/1.3073657
出版狀態	Published - 27 4月 2009

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abstract = "We quantitatively study the interface resistance in Ni/Nb multilayers fabricated by sputtering system. For a fixed Ni layer thickness in Ni/Nb/Ni trilayers, the superconducting temperature Tc decreases with decreasing Nb thickness. By analyzing the data with the proximity effect, the critical thickness below which superconductivity vanished was deduced. From current perpendicular to plane (CPP) measurement interpreted with a one-band series-resistor model, we obtained the CPP resistivities of Nb and Ni and the unit area resistances of 4.2±0.2 and 1.5±0.4 f m2 for superconducting and normal Ni/Nb interfaces. The transparency parameter is directly calculated in terms of interface resistance.",

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AU - Huang, S. Y.

AU - Chiu, Y. C.

AU - Liang, J. J.

AU - Lin, L. K.

AU - Tsai, T. C.

AU - Hsu, Shih-Ying

AU - Lee, S. F.

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N2 - We quantitatively study the interface resistance in Ni/Nb multilayers fabricated by sputtering system. For a fixed Ni layer thickness in Ni/Nb/Ni trilayers, the superconducting temperature Tc decreases with decreasing Nb thickness. By analyzing the data with the proximity effect, the critical thickness below which superconductivity vanished was deduced. From current perpendicular to plane (CPP) measurement interpreted with a one-band series-resistor model, we obtained the CPP resistivities of Nb and Ni and the unit area resistances of 4.2±0.2 and 1.5±0.4 f m2 for superconducting and normal Ni/Nb interfaces. The transparency parameter is directly calculated in terms of interface resistance.

AB - We quantitatively study the interface resistance in Ni/Nb multilayers fabricated by sputtering system. For a fixed Ni layer thickness in Ni/Nb/Ni trilayers, the superconducting temperature Tc decreases with decreasing Nb thickness. By analyzing the data with the proximity effect, the critical thickness below which superconductivity vanished was deduced. From current perpendicular to plane (CPP) measurement interpreted with a one-band series-resistor model, we obtained the CPP resistivities of Nb and Ni and the unit area resistances of 4.2±0.2 and 1.5±0.4 f m2 for superconducting and normal Ni/Nb interfaces. The transparency parameter is directly calculated in terms of interface resistance.

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Analysis of the proximity effect and the interface transparency with perpendicular current in Ni/Nb system

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