Analog module metrology using MNABST-1 P1149.4 test chip

Yue Tsang Chen*, Chau-Chin Su

*此作品的通信作者

研究成果: Conference article同行評審

摘要

This paper presents a metrology to extent P1149.4 from external component testing for internal module measurement. A series of experiment has been conducted to verify that the metrology is able to tolerate parasitic effects and test signal variation. As compare to the direct measurement, the metrology achieves an improvement of 14 dB in measurement SNR. Further more, it also extends the frequency range by one order.

原文English
頁(從 - 到)378-382
頁數5
期刊Proceedings of the Asian Test Symposium
出版狀態Published - 1 十二月 1998
事件Proceedings of the 1998 7th Asian Test Symposium - Singapore, Singapore
持續時間: 2 十二月 19984 十二月 1998

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