An Inaccuracy Thermal Sensor with a New Digital Calibration Algorithm in 12nm CMOS

Jun Wan Wu*, Yu Sin Chang, Ding Hao Wang, Po Hung Chen

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

This paper presents an inaccuracy thermal sensor with a new digital calibration algorithm in 12 nm CMOS process. The conventional temperature-to-digital converter calibration relies on the reproducibility of VBE, which slightly depends on the process variation and becomes a challenge in designing an accurate thermal sensor. This work develops a new digital calibration algorithm that treats environmental temperature as an absolute reference to overcome process variation. It calibrates the BJT |V_BE| error using |V_BE| differences between two devices. The thermal sensor consists of a bipolar core, a bandgap reference (BGR), and a 10-bit successive-approximation-register (SAR) analog-to-digital converter (ADC) is fabricated in 12nm CMOS process. Thanks to the proposed digital calibration algorithm, the measurement results demonstrate -2.09C~ 1.50C inaccuracy over a temperature range of 0C to 80C without any device trimming.

原文English
主出版物標題21st IEEE Interregional NEWCAS Conference, NEWCAS 2023 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9798350300246
DOIs
出版狀態Published - 2023
事件21st IEEE Interregional NEWCAS Conference, NEWCAS 2023 - Edinburgh, United Kingdom
持續時間: 26 6月 202328 6月 2023

出版系列

名字21st IEEE Interregional NEWCAS Conference, NEWCAS 2023 - Proceedings

Conference

Conference21st IEEE Interregional NEWCAS Conference, NEWCAS 2023
國家/地區United Kingdom
城市Edinburgh
期間26/06/2328/06/23

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