An improved measure of quality loss for notching processes

Keyphrases

• Quality Measures 100%
• Quality Loss 100%
• Improving Measures 100%
• Unbiased Estimator 66%
• Quality Assessment 66%
• Printed Circuit Board 66%
• Packaging Process 66%
• Integrated Substrate 66%
• Inspection Tools 33%
• Coverage Rate 33%
• Lower Confidence Bound 33%
• Process Capability 33%
• Numerical Simulation 33%
• Product Quality 33%
• Electronic Products 33%
• Loss Measurement 33%
• Bootstrap Method 33%
• Quality Requirements 33%
• Inspection Technique 33%
• Semiconductor Packaging 33%
• Parametric Bootstrap 33%
• Process Parameter Design 33%
• Product Packaging 33%

Engineering

• Quality Loss 100%
• Printed Circuit Board 66%
• Integrated Circuit Substrate 66%
• Process Capability 33%
• Quality Assessment 33%
• Product Quality 33%
• Process Parameter 33%
• Electronic Product 33%
• Product Definition 33%
• Inspection Procedure 33%