摘要
In this paper, an efficient bottom-up extraction approach is presented to generate accurate behavioral models of PLL circuits more quickly by using Verilog-AMS language. Not only top-down applications but also bottom-up applications can be supported by using our PLL models. The main idea is to use a special "characterization mode" to get critical circuit parameters. In the characterization mode, only two input patterns are enough to get circuit properties with parasitic effects. In the experimental results, we will build an accurate PLL behavioral models for demonstration compared to the HSPICE results and typical behavioral models.
| 原文 | English |
|---|---|
| 頁面 | 286-290 |
| 頁數 | 5 |
| DOIs | |
| 出版狀態 | Published - 2005 |
| 事件 | 2005 ACM Great Lakessymposium on VLSI, GLSVLSI'05 - Chicago, IL, 美國 持續時間: 17 4月 2005 → 19 4月 2005 |
Conference
| Conference | 2005 ACM Great Lakessymposium on VLSI, GLSVLSI'05 |
|---|---|
| 國家/地區 | 美國 |
| 城市 | Chicago, IL |
| 期間 | 17/04/05 → 19/04/05 |
指紋
深入研究「An efficient bottom-up extraction approach to build accurate PLL behavioral models for SOC designs」主題。共同形成了獨特的指紋。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver