摘要
Multilevel flash memory cells double or even triple storage density, producing affordable solid-state disks for end users. As flashmemory endures only limited program-erase cycles, solid-state disks employ wear-leveling methods to prevent any portions of flash memory from being retired prematurely. Modern solid-state disks must consider wear evenness at both block and channel levels. This study first presents a block-level wearlevelingmethod whose design has two new ideas. First, the proposed method reuses the intelligence available in flash-translation layers so it does not require any new data structures. Second, it adaptively tunes the threshold of block-level wear leveling according to the runtime write pattern. This study further introduces a new channel-level wear-leveling strategy, because block-level wear leveling is confined to a channel, but realistic workloads do not evenly write all channels. The proposed method swaps logical blocks among channels for achieving an eventually-even state of channel lifetimes. A series of trace-driven simulations show that ourwear-levelingmethod outperforms existing approaches in terms ofwear evenness and overhead reduction.
原文 | English |
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文章編號 | 55 |
期刊 | Transactions on Embedded Computing Systems |
卷 | 13 |
發行號 | 3 |
DOIs | |
出版狀態 | Published - 1 12月 2013 |