Advanced imaging of nanometer-scale recorded bits on super-resolution near-field optical disk

Pei Lin Yang, Pei Hsin Chang, Chih Ching Hsu, Wei Chih Lin, Tsung-Sheng Kao, Cheng Wei Lin, Din Ping Tsai

研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)

摘要

An advanced imaging technique is demonstrated for fast, non-destructive and high resolution characterizations for nanometer-scale recorded bits on a super-resolution near-field optical disk (super-RENS), For the first time, an array of individual 100 nm recorded marks is imaged and studied by using the conductive-atomic force microscopy (C-AFM) method. Discussions also include comparisons of 300 nm, 200 nm and 100 nm recorded marks on both a super-RENS disk and a commercial DVD disk, and the image results are evidence of the high carrier-to-noise ratio (CNR) value on the super-RENS disk, even though the mark size has been shrunk to less than the diffraction limit.

原文English
頁(從 - 到)S115-S118
期刊Journal of the Korean Physical Society
47
發行號SUPPL. 1
出版狀態Published - 8月 2005

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