Advanced Atomic Layer Deposition Technologies for Micro-LEDs and VCSELs

Yen Wei Yeh, Su Hui Lin, Tsung Chi Hsu, Shouqiang Lai, Po Tsung Lee, Shui Yang Lien, Dong Sing Wuu, Guisen Li, Zhong Chen, Tingzhu Wu, Hao Chung Kuo*

*此作品的通信作者

研究成果: Review article同行評審

16 引文 斯高帕斯(Scopus)

摘要

In recent years, the process requirements of nano-devices have led to the gradual reduction in the scale of semiconductor devices, and the consequent non-negligible sidewall defects caused by etching. Since plasma-enhanced chemical vapor deposition can no longer provide sufficient step coverage, the characteristics of atomic layer deposition ALD technology are used to solve this problem. ALD utilizes self-limiting interactions between the precursor gas and the substrate surface. When the reactive gas forms a single layer of chemical adsorbed on the substrate surface, no reaction occurs between them and the growth thickness can be controlled. At the Å level, it can provide good step coverage. In this study, recent research on the ALD passivation on micro-light-emitting diodes and vertical cavity surface emitting lasers was reviewed and compared. Several passivation methods were demonstrated to lead to enhanced light efficiency, reduced leakage, and improved reliability.

原文English
文章編號164
期刊Nanoscale Research Letters
16
發行號1
DOIs
出版狀態Published - 2021

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