Adaptive on-die termination resistors for high-speed transceiver

Chih Hsien Lin; Chih Ning Chen; Shyh-Jye Jou

doi:10.1109/VDAT.2005.1500028

Adaptive on-die termination resistors for high-speed transceiver

Chih Hsien Lin^*, Chih Ning Chen, Shyh-Jye Jou

^*此作品的通信作者

研究成果: Conference contribution › 同行評審

4 引文斯高帕斯（Scopus）

摘要

As the demand of data transmission bandwidth is increased, the issue of impedance matching becomes important factor for the high-speed serial link transceiver. Especially, there are many standards of the characteristic impedance in today's transmission media. We propose a digital approach of on-die adaptive termination resistors in the transceiver. It can match the characteristic impedance of coaxial cable automatically from 75 Ω ∼45 Ω without any external component and bias. Using tsmc 0.18 um CMOS process, the tuning process can be finished in 14 clock cycles and the difference between termination resistor and coaxial cable is less than 5Ω for the range of characteristic impedance from 75 Ω to 45 Ω.

原文	English
主出版物標題	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
頁面	96-99
頁數	4
DOIs	https://doi.org/10.1109/VDAT.2005.1500028
出版狀態	Published - 2005
事件	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) - Hsinchu, 台灣持續時間: 27 4月 2005 → 29 4月 2005

出版系列

名字	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
卷	2005

Conference

Conference	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
國家/地區	台灣
城市	Hsinchu
期間	27/04/05 → 29/04/05

存取文件

10.1109/VDAT.2005.1500028

其它文件與鏈接

Link to publication in Scopus

引用此

Lin, C. H., Chen, C. N., & Jou, S.-J. (2005). Adaptive on-die termination resistors for high-speed transceiver. 於 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) (頁 96-99). 文章 1500028 (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); 卷 2005). https://doi.org/10.1109/VDAT.2005.1500028

@inproceedings{066311033183498e80bac802ad6f2eff,

title = "Adaptive on-die termination resistors for high-speed transceiver",

abstract = "As the demand of data transmission bandwidth is increased, the issue of impedance matching becomes important factor for the high-speed serial link transceiver. Especially, there are many standards of the characteristic impedance in today's transmission media. We propose a digital approach of on-die adaptive termination resistors in the transceiver. It can match the characteristic impedance of coaxial cable automatically from 75 Ω ∼45 Ω without any external component and bias. Using tsmc 0.18 um CMOS process, the tuning process can be finished in 14 clock cycles and the difference between termination resistor and coaxial cable is less than 5Ω for the range of characteristic impedance from 75 Ω to 45 Ω.",

author = "Lin, {Chih Hsien} and Chen, {Chih Ning} and Shyh-Jye Jou",

year = "2005",

doi = "10.1109/VDAT.2005.1500028",

language = "English",

isbn = "0780390601",

series = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)",

pages = "96--99",

booktitle = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)",

note = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) ; Conference date: 27-04-2005 Through 29-04-2005",

}

Lin, CH, Chen, CN & Jou, S-J 2005, Adaptive on-die termination resistors for high-speed transceiver. 於 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)., 1500028, 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT), 卷 2005, 頁 96-99, 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT), Hsinchu, 台灣, 27/04/05. https://doi.org/10.1109/VDAT.2005.1500028

Adaptive on-die termination resistors for high-speed transceiver. / Lin, Chih Hsien; Chen, Chih Ning; Jou, Shyh-Jye.
2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT). 2005. p. 96-99 1500028 (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); 卷 2005).

研究成果: Conference contribution › 同行評審

TY - GEN

T1 - Adaptive on-die termination resistors for high-speed transceiver

AU - Lin, Chih Hsien

AU - Chen, Chih Ning

AU - Jou, Shyh-Jye

PY - 2005

Y1 - 2005

N2 - As the demand of data transmission bandwidth is increased, the issue of impedance matching becomes important factor for the high-speed serial link transceiver. Especially, there are many standards of the characteristic impedance in today's transmission media. We propose a digital approach of on-die adaptive termination resistors in the transceiver. It can match the characteristic impedance of coaxial cable automatically from 75 Ω ∼45 Ω without any external component and bias. Using tsmc 0.18 um CMOS process, the tuning process can be finished in 14 clock cycles and the difference between termination resistor and coaxial cable is less than 5Ω for the range of characteristic impedance from 75 Ω to 45 Ω.

AB - As the demand of data transmission bandwidth is increased, the issue of impedance matching becomes important factor for the high-speed serial link transceiver. Especially, there are many standards of the characteristic impedance in today's transmission media. We propose a digital approach of on-die adaptive termination resistors in the transceiver. It can match the characteristic impedance of coaxial cable automatically from 75 Ω ∼45 Ω without any external component and bias. Using tsmc 0.18 um CMOS process, the tuning process can be finished in 14 clock cycles and the difference between termination resistor and coaxial cable is less than 5Ω for the range of characteristic impedance from 75 Ω to 45 Ω.

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U2 - 10.1109/VDAT.2005.1500028

DO - 10.1109/VDAT.2005.1500028

M3 - Conference contribution

AN - SCOPUS:33745439239

SN - 0780390601

SN - 9780780390607

T3 - 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)

SP - 96

EP - 99

BT - 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)

T2 - 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)

Y2 - 27 April 2005 through 29 April 2005

ER -

Adaptive on-die termination resistors for high-speed transceiver

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