Abnormal positive bias stress instability of In-Ga-Zn-O thin-film transistors with low-temperature Al2O3 gate dielectric

Yu Hong Chang, Ming Jiue Yu, Ruei Ping Lin, Chih Pin Hsu, Tuo-Hung Hou*

*此作品的通信作者

研究成果: Article › 同行評審

68 引文 斯高帕斯（Scopus）

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Keyphrases

Engineering

Material Science