Abnormal hump in capacitance-voltage measurements induced by ultraviolet light in a-IGZO thin-film transistors

Yu Ching Tsao, Ting Chang Chang*, Hua Mao Chen, Bo Wei Chen, Hsiao Cheng Chiang, Guan Fu Chen, Yu Chieh Chien, Ya-Hsiang Tai, Yu Ju Hung, Shin Ping Huang, Chung Yi Yang, Wu-Ching Chou

*此作品的通信作者

研究成果: Article › 同行評審

16 引文 斯高帕斯（Scopus）

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Keyphrases

Physics

Chemical Engineering

Material Science

Immunology and Microbiology

Neuroscience