TY - JOUR
T1 - A wafer-level hermetic encapsulation for MEMS manufacture application
AU - Liang, Zhi Hao
AU - Cheng, Yu-Ting
AU - Hsu, Wen-Syang
AU - Lee, Yuh Wen
PY - 2006/8
Y1 - 2006/8
N2 - In order to simplify the processing complexity and cut down the manufacturing cost, a new wafer bonding technique using ultraviolet (UV) curable adhesive is introduced here for microelectromechanical systems (MEMS) device packaging and manufacturing applications. UV curable adhesive is cured through UV light exposure without any heating process that is suitable for the packaging of temperature-sensitive materials or devices. A Pyrex 7740 glass is chemically wet etched to form microcavities and utilized as the protection cap substrate. After a UV-curable adhesive is spin-coated onto the glass substrate, the substrate is then aligned and bonded through UV light exposure with a device substrate below. Electrical contact pad opening and die separation are done simultaneously by dicing. Two different testing devices, a dew point sensor and capacitive accelerometer, are built to evaluate the package strength and hermeticity. After the dicing process, no structural damage or stiction phenomenon is found in the packaged parallel capacitor. The acceleration test results also indicate that the package using the Loctite 3491 UV adhesive with 150 μm bond width can survive more than 300 days at a 25 °C and 100% relative humidity working environment.
AB - In order to simplify the processing complexity and cut down the manufacturing cost, a new wafer bonding technique using ultraviolet (UV) curable adhesive is introduced here for microelectromechanical systems (MEMS) device packaging and manufacturing applications. UV curable adhesive is cured through UV light exposure without any heating process that is suitable for the packaging of temperature-sensitive materials or devices. A Pyrex 7740 glass is chemically wet etched to form microcavities and utilized as the protection cap substrate. After a UV-curable adhesive is spin-coated onto the glass substrate, the substrate is then aligned and bonded through UV light exposure with a device substrate below. Electrical contact pad opening and die separation are done simultaneously by dicing. Two different testing devices, a dew point sensor and capacitive accelerometer, are built to evaluate the package strength and hermeticity. After the dicing process, no structural damage or stiction phenomenon is found in the packaged parallel capacitor. The acceleration test results also indicate that the package using the Loctite 3491 UV adhesive with 150 μm bond width can survive more than 300 days at a 25 °C and 100% relative humidity working environment.
KW - Acceleration tests
KW - Driven-out spin method
KW - Hermetic encapsulation
KW - Low-temperature wafer bonding
KW - Microelectromechanical systems (MEMS) manufacturing
KW - Post-process
KW - Ultraviolet (UV) adhesive
KW - Wafer-level packaging
UR - http://www.scopus.com/inward/record.url?scp=33747618731&partnerID=8YFLogxK
U2 - 10.1109/TADVP.2006.875092
DO - 10.1109/TADVP.2006.875092
M3 - Article
AN - SCOPUS:33747618731
SN - 1521-3323
VL - 29
SP - 513
EP - 519
JO - IEEE Transactions on Advanced Packaging
JF - IEEE Transactions on Advanced Packaging
IS - 3
ER -