A unified approach to detecting crosstalk faults of interconnects in deep sub-micron VLSI

Katherine Shu Min Li*, Chung Len Lee, Chau-Chin Su, Jwu E. Chen

*此作品的通信作者

研究成果: Paper同行評審

14 引文 斯高帕斯(Scopus)

摘要

The crosstalk fault effects in deep sub-micron VLSI, namely, glitches and the crosstalk-induced delay, are investigated. The origin of their occurrence, relationship and importance in circuit operation are elucidated. It is shown that the crosstalk-induced delay is only superposition of the induced glitch with the original signal delay on the affected victim line; and crosstalk-induced delay is more important in affecting the circuit performance, and should be considered in more details for testing. A scheme which is to detect both types of faults in a unified way by just detecting glitches is proposed and studied considering the manufacture process variation. In this way, detection of crosstalk-induced faults becomes much easier.

原文American English
頁面145-150
頁數6
DOIs
出版狀態Published - 15 11月 2004
事件Proceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan
持續時間: 15 11月 200417 11月 2004

Conference

ConferenceProceedings of the Asian Test Symposium, ATS'04
國家/地區Taiwan
城市Kenting
期間15/11/0417/11/04

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