摘要
The crosstalk fault effects in deep sub-micron VLSI, namely, glitches and the crosstalk-induced delay, are investigated. The origin of their occurrence, relationship and importance in circuit operation are elucidated. It is shown that the crosstalk-induced delay is only superposition of the induced glitch with the original signal delay on the affected victim line; and crosstalk-induced delay is more important in affecting the circuit performance, and should be considered in more details for testing. A scheme which is to detect both types of faults in a unified way by just detecting glitches is proposed and studied considering the manufacture process variation. In this way, detection of crosstalk-induced faults becomes much easier.
原文 | American English |
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頁面 | 145-150 |
頁數 | 6 |
DOIs | |
出版狀態 | Published - 15 11月 2004 |
事件 | Proceedings of the Asian Test Symposium, ATS'04 - Kenting, 台灣 持續時間: 15 11月 2004 → 17 11月 2004 |
Conference
Conference | Proceedings of the Asian Test Symposium, ATS'04 |
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國家/地區 | 台灣 |
城市 | Kenting |
期間 | 15/11/04 → 17/11/04 |