A TSV noise-aware 3-D placer

Yu-Min Lee, Chun Chen, Jiaxing Song, Kuan Te Pan

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

摘要

In this work, a three-dimensional partitioning-based force-directed placer is developed to minimize coupling noise between through silicon vias (TSVs) in three-dimensional integrated circuits. TSV decoupling force is introduced and determined by the TSV coupling noise to separate TSVs with strong coupling noise. The experimental results indicate that TSV coupling noise can be effectively reduced by 36.3% on average with only 6.0% wirelength overhead. Besides, the developed 3-D placer shows great performance in wirelength that is competitive to a state-of-the-art 3-D placer.

原文English
主出版物標題Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1653-1658
頁數6
ISBN(電子)9783981537048
出版狀態Published - 22 4月 2015
事件2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 - Grenoble, France
持續時間: 9 3月 201513 3月 2015

出版系列

名字Proceedings -Design, Automation and Test in Europe, DATE
2015-April
ISSN(列印)1530-1591

Conference

Conference2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
國家/地區France
城市Grenoble
期間9/03/1513/03/15

指紋

深入研究「A TSV noise-aware 3-D placer」主題。共同形成了獨特的指紋。

引用此