A temperature accelerated model for high state retention loss of nitride storage flash memory

M. Y. Lee*, N. K. Zous, Trista Huang, W. J. Tsai, Albert Kuo, Ta-Hui Wang, Shaw Yin, Chih Yuan Lu

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    2 引文 斯高帕斯（Scopus）

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    Engineering

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    Material Science

    Earth and Planetary Sciences

    Physics

    Chemical Engineering