TY - GEN
T1 - A System-Level Thermal Simulator with Automatic Meshing Techniques
AU - Wang, Jui Hung
AU - Lee, Yu-Min
AU - Hsiao, Hsuan Hsuan
AU - Cheng, Liang Chia
PY - 2018/7/24
Y1 - 2018/7/24
N2 - The grid structure of most numerical thermal simulators has to be designed artificially. Designers might need to try many different grid structures for getting accurate thermal profiles, and, hence, waste a great of runtime. In order to solve this problem, this work presents a system-level thermal simulator, DeNAFE, which can adaptively mesh thermal grids automatically. First, we develop and employ a fast thermal estimation engine to roughly obtain the thermal profile of the system. Then, with this thermal profile, we propose and utilize an adaptive meshing procedure to decide its grid structure and perform thermal simulation. Compared with a commercial tool, ANSYS Icepak, the experimental results show that the speedup of DeNAFE can be up to two orders of magnitude with only 6.09% maximum error for all chips in the steady-state thermal simulation. Furthermore, the error of chips is less than 5.25%, the error of screen/skin is less than 6.03%, and the speedup can be over 171.12 times in the transient simulation.
AB - The grid structure of most numerical thermal simulators has to be designed artificially. Designers might need to try many different grid structures for getting accurate thermal profiles, and, hence, waste a great of runtime. In order to solve this problem, this work presents a system-level thermal simulator, DeNAFE, which can adaptively mesh thermal grids automatically. First, we develop and employ a fast thermal estimation engine to roughly obtain the thermal profile of the system. Then, with this thermal profile, we propose and utilize an adaptive meshing procedure to decide its grid structure and perform thermal simulation. Compared with a commercial tool, ANSYS Icepak, the experimental results show that the speedup of DeNAFE can be up to two orders of magnitude with only 6.09% maximum error for all chips in the steady-state thermal simulation. Furthermore, the error of chips is less than 5.25%, the error of screen/skin is less than 6.03%, and the speedup can be over 171.12 times in the transient simulation.
KW - adaptive meshing
KW - circuit simulation
KW - fast thermal estimator
KW - finite difference method (FDM)
KW - heat transfer equation
KW - thermal gradient
UR - http://www.scopus.com/inward/record.url?scp=85051092344&partnerID=8YFLogxK
U2 - 10.1109/ITHERM.2018.8419468
DO - 10.1109/ITHERM.2018.8419468
M3 - Conference contribution
AN - SCOPUS:85051092344
T3 - Proceedings of the 17th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2018
SP - 984
EP - 991
BT - Proceedings of the 17th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 17th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2018
Y2 - 29 May 2018 through 1 June 2018
ER -