A study on the radiation hardness of flash cell with horn-shaped floating-gate

Keyphrases

• Closure Rate 20%
• Co-60 20%
• Cycling Endurance 40%
• Data Retention 20%
• Efficiency Threshold 20%
• Erase Efficiency 20%
• Floating Gate 100%
• High Threshold Voltage 20%
• Irradiation 60%
• Junction Leakage 20%
• Low Threshold Voltage 20%
• Program State 20%
• Radiation Effects 20%
• Radiation Hardness 100%
• Read Current 100%
• Read Only Memory 20%
• Split Gate 20%
• Threshold Voltage 20%

Engineering

• Data Retention 50%
• Floating Gate 100%
• Programmable Read-Only Memory 50%

Computer Science

• Data Retention 33%
• Erasable Programmable Read-Only Memory 33%
• Program State 33%
• Threshold Voltage 100%