@article{ac219825c47445e08a33e11d8a698724,
title = "A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications",
abstract = "The security protection of the Internet of Things urges the design of low electromagnetic interference (EMI) and small power signature in power chips. To achieve high security, small chip area, and high efficiency, this letter proposes a single-inductor-triple-output (SITO) buck dc-dc converter with electromagnetic (EM) gated low dropouts (LDOs) to reduce the EM-leaked signature. Experimental results show that the peak value of EMI noise can be reduced from 88.44 to 54.92 dB mV, complying with EN 55032 Class B specifications. In addition, it can achieve 3 billion (B) minimum traces to disclosure (MTD) under power side-channel attack, which is at least three times improvement compared to prior-arts.",
keywords = "Advanced encryption standard (AES), digital low dropout voltage regulator (DLDO), electromagnetic (EM)-leaked signature, electromagnetic interference (EMI), hardware security, side-channel attack (SCA), true random number generator (TRNG)",
author = "Hsu, {Ya Ting} and Chung, {Kai Cheng} and Ouyang, {Yu Jheng} and Chen, {Ke Horng} and Zheng, {Kuo Lin} and Lin, {Ying Hsi} and Lin, {Shian Ru} and Tsai, {Tsung Yen}",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.",
year = "2023",
doi = "10.1109/LSSC.2023.3260952",
language = "English",
volume = "6",
pages = "89--92",
journal = "IEEE Solid-State Circuits Letters",
issn = "2573-9603",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
}