A simple transmission line de-embedding method for accurate RF CMOS noise modeling

Jyh-Chyurn Guo*, C. H. Huang, W. Y. Lien, C. M. Wu

*此作品的通信作者

    研究成果: Paper同行評審

    4 引文 斯高帕斯(Scopus)

    摘要

    We propose a simple method to de-embed the transmission line and pads' parasitics from the measured RF noise of multi-finger MOSFETs with aggressive gate length scaling down to 80 nm and 65 nm respectively. Good agreement has been realized between measurement and simulation in terms of S-parameters and NFmin (minimum noise figure) for RF CMOS devices with various finger numbers by using this novel de-embedding method. The extracted NFmin after de-embedding matches well with the published noise correlation matrix method but is relatively simple without resort to complicated matrices calculation.

    原文English
    頁面607-610
    頁數4
    DOIs
    出版狀態Published - 6月 2004
    事件Digest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Fort Worth, TX, United States
    持續時間: 6 6月 20048 6月 2004

    Conference

    ConferenceDigest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium
    國家/地區United States
    城市Fort Worth, TX
    期間6/06/048/06/04

    指紋

    深入研究「A simple transmission line de-embedding method for accurate RF CMOS noise modeling」主題。共同形成了獨特的指紋。

    引用此