@inproceedings{b8c4e401031243a6866430caa6031378,
title = "A process/device/circuit/system compatible simulation framework for poly-Si TFT based SRAM design",
abstract = "Operation characteristics of low temperature poly silicon thin-film transistor (LTPS-TFT) based systems vary significantly with design choices and parameters (i.e., process, device, circuit and system). Due to the lack of cross-layer simulation tool, conventional designs only optimize the design layers in isolation, leading to sub-optimal solutions. We present a cross-layer simulation framework for the design of LTPS-TFT Static Random Access Memory (SRAM). The proposed simulation framework optimizes design parameters considering the entire design space and hence, greatly reduces design complexity and efforts. The benefits of our proposed framework are illustrated by case studies.",
keywords = "LTPS, SRAM, TFT, design optimization, poly-Si, yield estimation",
author = "Lin, {Chen Wei} and Ho, {Chih Hsiang} and Chao Lu and Chia-Tso Chao and Kaushik Roy",
year = "2013",
doi = "10.1109/SISPAD.2013.6650669",
language = "English",
isbn = "9781467357364",
series = "International Conference on Simulation of Semiconductor Processes and Devices, SISPAD",
pages = "440--443",
booktitle = "2013 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2013",
note = "18th International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2013 ; Conference date: 03-09-2013 Through 05-09-2013",
}