A novel way of LTPS model extraction with hysteresis and transient current analysis

Chen Hao Kuo, Yung Sheng Tsai, Ching Chieh Tseng, Chee Wai Lau, Chun Yen Liu, Hannibal Wang, Leon Huang, Scott Lin, You Pang Wei, Po-Tsun Liu

研究成果: Conference article同行評審

6 引文 斯高帕斯(Scopus)

摘要

Time-sampling measurements are used in this paper to build time dependent L TPS TFT current model The device model that considers bias and time dependent threshold voltage (Vth) shift and mobility degradation is implemented in Eldo through GUDM for simulating a pixel circuit as an indicator of panel performance.

原文English
頁(從 - 到)1123-1126
頁數4
期刊Digest of Technical Papers - SID International Symposium
46
發行號Book 3
DOIs
出版狀態Published - 1 6月 2015
事件2015 SID International Symposium - San Jose, United States
持續時間: 2 6月 20153 6月 2015

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