A novel way of LTPS model extraction with hysteresis and transient current analysis

Chen Hao Kuo; Yung Sheng Tsai; Ching Chieh Tseng; Chee Wai Lau; Chun Yen Liu; Hannibal Wang; Leon Huang; Scott Lin; You Pang Wei; Po-Tsun Liu

doi:10.1002/sdtp.10022

A novel way of LTPS model extraction with hysteresis and transient current analysis

Chen Hao Kuo, Yung Sheng Tsai, Ching Chieh Tseng, Chee Wai Lau, Chun Yen Liu, Hannibal Wang, Leon Huang, Scott Lin, You Pang Wei, Po-Tsun Liu

光電工程學系

研究成果: Conference article › 同行評審

4 引文斯高帕斯（Scopus）

摘要

Time-sampling measurements are used in this paper to build time dependent L TPS TFT current model The device model that considers bias and time dependent threshold voltage (V_th) shift and mobility degradation is implemented in Eldo through GUDM for simulating a pixel circuit as an indicator of panel performance.

原文	English
頁（從 - 到）	1123-1126
頁數	4
期刊	Digest of Technical Papers - SID International Symposium
卷	46
發行號	Book 3
DOIs	https://doi.org/10.1002/sdtp.10022
出版狀態	Published - 1 6月 2015
事件	2015 SID International Symposium - San Jose, United States 持續時間: 2 6月 2015 → 3 6月 2015

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10.1002/sdtp.10022

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引用此

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title = "A novel way of LTPS model extraction with hysteresis and transient current analysis",

abstract = "Time-sampling measurements are used in this paper to build time dependent L TPS TFT current model The device model that considers bias and time dependent threshold voltage (Vth) shift and mobility degradation is implemented in Eldo through GUDM for simulating a pixel circuit as an indicator of panel performance.",

keywords = "Eldo, GUDM, LTPS, Time-sampling measurement, Transient current, V degradation",

author = "Kuo, {Chen Hao} and Tsai, {Yung Sheng} and Tseng, {Ching Chieh} and Lau, {Chee Wai} and Liu, {Chun Yen} and Hannibal Wang and Leon Huang and Scott Lin and Wei, {You Pang} and Po-Tsun Liu",

year = "2015",

month = jun,

day = "1",

doi = "10.1002/sdtp.10022",

language = "English",

volume = "46",

pages = "1123--1126",

journal = "Digest of Technical Papers - SID International Symposium",

issn = "0097-966X",

number = "Book 3",

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T1 - A novel way of LTPS model extraction with hysteresis and transient current analysis

AU - Kuo, Chen Hao

AU - Tsai, Yung Sheng

AU - Tseng, Ching Chieh

AU - Lau, Chee Wai

AU - Liu, Chun Yen

AU - Wang, Hannibal

AU - Huang, Leon

AU - Lin, Scott

AU - Wei, You Pang

AU - Liu, Po-Tsun

PY - 2015/6/1

Y1 - 2015/6/1

N2 - Time-sampling measurements are used in this paper to build time dependent L TPS TFT current model The device model that considers bias and time dependent threshold voltage (Vth) shift and mobility degradation is implemented in Eldo through GUDM for simulating a pixel circuit as an indicator of panel performance.

AB - Time-sampling measurements are used in this paper to build time dependent L TPS TFT current model The device model that considers bias and time dependent threshold voltage (Vth) shift and mobility degradation is implemented in Eldo through GUDM for simulating a pixel circuit as an indicator of panel performance.

KW - Eldo

KW - GUDM

KW - LTPS

KW - Time-sampling measurement

KW - Transient current

KW - V degradation

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U2 - 10.1002/sdtp.10022

DO - 10.1002/sdtp.10022

M3 - Conference article

AN - SCOPUS:84962678159

SN - 0097-966X

VL - 46

SP - 1123

EP - 1126

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

IS - Book 3

Y2 - 2 June 2015 through 3 June 2015

ER -

A novel way of LTPS model extraction with hysteresis and transient current analysis

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