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A Novel Sensor-Based Label-Smoothing Technique for Machine State Degradation
Ko Chieh Chao, Yu Shih,
Ching Hung Lee
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電控工程研究所
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引文 斯高帕斯（Scopus）
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Keyphrases
Smoothing Methods
100%
Sensor-based
100%
State Degradation
100%
Transition Region
100%
Machine States
100%
Novel Sensor
100%
Label Smoothing
100%
Machine Degradation
100%
Degradation Model
75%
Model Performance
50%
Fault State
50%
Prediction Accuracy
25%
Model Accuracy
25%
Degradation Process
25%
Process Change
25%
Production Increase
25%
Training Model
25%
Industry 4.0 (I4.0)
25%
Production Yield
25%
Similar Features
25%
Sensor Data
25%
Production Cost
25%
Smoothing Model
25%
Tool Wear
25%
Complete Life Cycle
25%
Preprocessing Data
25%
Degradation Level
25%
Machine Maintenance
25%
Novel Labels
25%
Long-term Operating
25%
Low Production
25%
Run-to-failure
25%
Data Label
25%
Machine Health Monitoring
25%
Condition State
25%
Peer Methods
25%
Health Prognosis
25%
Safety Hazards
25%
Engineering
Degradation Model
100%
State Machine
100%
Experimental Result
33%
Data Preprocessing
33%
Hazards
33%
Health Monitoring
33%
Sensor Data
33%
State Condition
33%
Entire Life Cycle
33%
Degradation Process
33%
Earth and Planetary Sciences
Life Cycle
100%
Production Cost
100%
Hazards
100%