A novel array-based test methodology for local process variation monitoring

Tseng Chin Luo*, Chia-Tso Chao, Michael S.Y. Wu, Kuo Tsai Li, Chin C. Hsia, Huan Chi Tseng, Chuen Uan Huang, Yuan Yao Chang, Samuel C. Pan, Konrad K.L. Young

*此作品的通信作者

    研究成果: Conference contribution同行評審

    5 引文 斯高帕斯(Scopus)

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    Mathematics

    Engineering & Materials Science