A note on "capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk"

W.l. Pearn, Chia-Huang Wu*, M. C. Tsai

*此作品的通信作者

研究成果: Article同行評審

24 引文 斯高帕斯(Scopus)

指紋

深入研究「A note on "capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk"」主題。共同形成了獨特的指紋。

Business & Economics

Engineering & Materials Science