A note on "capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk"

W.l. Pearn, Chia-Huang Wu*, M. C. Tsai

*此作品的通信作者

研究成果: Article同行評審

24 引文 斯高帕斯(Scopus)

摘要

The generalized yield index CpkT establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index CPUT was considered, and the asymptotic distribution of the natural estimator C^PUT was developed. Then, we derived the lower confidence bounds as well as the critical values of index CPUT. We not only provided some tables but also presented an application example.

原文English
頁(從 - 到)159-163
頁數5
期刊Quality and Reliability Engineering International
29
發行號2
DOIs
出版狀態Published - 1 3月 2013

指紋

深入研究「A note on "capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk"」主題。共同形成了獨特的指紋。

引用此