A new process capability index for non-normal distributions

Jann Pygn Chen, Cherng G. Ding

研究成果: Review article同行評審

37 引文 斯高帕斯(Scopus)

摘要

Many process capability indices have been proposed to measure process performance. In this paper, we first review Cp, Cpk, Cpm and Cpmk, and their generalizations, CNp, CNpk, CNpm and CNpmk, and then propose a new index Spmk for any underlying distribution, which takes into account process variability, departure of the process mean from the target value, and proportion of nonconformity. Proportion of nonconformity can be exactly reflected by Spmk. Its superiority over CNpmk, a recently developed index, also taking into account process variability and departure from the target value, is demonstrated with several non-normal processes. A method is proposed to estimate Spmk, with illustrations.

原文English
頁(從 - 到)762-770
頁數9
期刊International Journal of Quality and Reliability Management
18
發行號7
DOIs
出版狀態Published - 1 12月 2001

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